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ULSI Devices by Simon M. Sze (2000, Hardcover)
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Publisher: WileyBlackwell ISBN 13: 9780471240679. Title: ULSI Devices Item Condition: New. Author: C. Y. Chang, Simon M. Sze ISBN 10: 0471240672. Will be clean, not soiled or stained. Books will be free of page markings.
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About this product
Product Identifiers
PublisherWiley & Sons, Incorporated, John
ISBN-100471240672
ISBN-139780471240679
eBay Product ID (ePID)542889
Product Key Features
Number of Pages744 Pages
Publication NameUlsi Devices
LanguageEnglish
Publication Year2000
SubjectElectronics / Semiconductors, Electronics / Circuits / Vlsi & Ulsi
TypeTextbook
AuthorSimon M. Sze
Subject AreaTechnology & Engineering
FormatHardcover
Dimensions
Item Height1.5 in
Item Weight38.3 Oz
Item Length9.6 in
Item Width6.4 in
Additional Product Features
Intended AudienceScholarly & Professional
LCCN99-029979
Reviews"the production standard and component chapters is characteristically high" (Contemporary Physics, Vol.42, No. 4 2001)
Dewey Edition21
IllustratedYes
Dewey Decimal621.39/5
Table Of ContentIntroduction (C. Chang & S. Sze). DEVICE FUNDAMENTALS. Bipolar Transistor Fundamentals (E. Kasper). MOSFET Fundamentals (P. Wong). Device Miniaturization and Simulation (S. Banerjee & B. Streetman). DEVICE BUILDING BLOCKS AND ADVANCED DEVICE STRUCTURES. SOI and Three-Dimensional Structures. (J. Colinge). The Hot-Carrier Effect (B. Doyle). DRAM and SRAM (S. Shichijo). Nonvolatile Memory (J. Caywood & G. Derbenwich). CIRCUIT BUILDING BLOCKS AND SYSTEM-IN-CHIP CONCEPT. CMOS Digital and Analog Building Block Circuits for Mixed-Signal Applications (D. Pehlke & M. Chang). High-Speed or Low-Voltage, Low-Power Operations (I. Chen & W. Liu). System-on-Chip Concepts (M. Pelgrom). Appendices. Index.
SynopsisUltrahoch integrierte Schaltkreise (ULSI) - die n chste Schaltkreisgeneration - werden zwar noch nicht industriell eingesetzt, sind aber das Objekt intensiver Forschungsarbeit. Sie versprechen Vorteile im Stromverbrauch, arbeiten bei niedrigerer Spannung und sind schneller. Die Herausgeber dieses Buches haben die bekanntesten Forscher auf dem Gebiet der Schaltkreise gewonnen, um jeweils ein Kapitel zu ihrem eigenen Spezialgebiet zu schreiben. Kompetent und hochaktuell (01/00), A complete guide to current knowledge and future trends in ULSIdevices Ultra-Large-Scale Integration (ULSI), the next generationof semiconductor devices, has become a hot topic of investigation.ULSI Devices provides electrical and electronic engineers, appliedphysicists, and anyone involved in IC design and processdevelopment with a much-needed overview of key technology trends inthis area. Edited by two of the foremost authorities onsemiconductor device physics, with contributions by some of thebest-known researchers in the field, this comprehensive referenceexamines such major ULSI devices as MOSFET, nonvolatilesemiconductor memory (NVSM), and the bipolar transistor, and theimprovements these devices offer in power consumption, low-voltageand high-speed operation, and system-on-chip for ULSI applications.Supplemented with introductory material and references for eachchapter as well as more than 400 illustrations, coverageincludes: * The physics and operational characteristics of the differentcomponents * The evolution of device structures the ultimate limitations ondevice and circuit performance * Device miniaturization and simulation * Issues of reliability and the hot carrier effect * Digital and analog circuit building blocks *An Instructor's Manual presenting detailed solutions to all theproblems in the book is available from the Wiley editorialdepartment, One of the hottest topics in the area of semiconductor devices, ultra large scale integrated circuits (ULSI) are the subject of intense research in both academia and industry. This collection of expert contributions is compiled and edited by two of the foremost authorities on semiconductor device physics., A complete guide to current knowledge and future trends in ULSI devices Ultra-Large-Scale Integration (ULSI), the next generation of semiconductor devices, has become a hot topic of investigation. ULSI Devices provides electrical and electronic engineers, applied physicists, and anyone involved in IC design and process development with a much-needed overview of key technology trends in this area. Edited by two of the foremost authorities on semiconductor device physics, with contributions by some of the best-known researchers in the field, this comprehensive reference examines such major ULSI devices as MOSFET, nonvolatile semiconductor memory (NVSM), and the bipolar transistor, and the improvements these devices offer in power consumption, low-voltage and high-speed operation, and system-on-chip for ULSI applications. Supplemented with introductory material and references for each chapter as well as more than 400 illustrations, coverage includes: ∗ The physics and operational characteristics of the different components ∗ The evolution of device structures the ultimate limitations on device and circuit performance ∗ Device miniaturization and simulation ∗ Issues of reliability and the hot carrier effect ∗ Digital and analog circuit building blocks, A complete guide to current knowledge and future trends in ULSI devices Ultra-Large-Scale Integration (ULSI), the next generation of semiconductor devices, has become a hot topic of investigation. ULSI Devices provides electrical and electronic engineers, applied physicists, and anyone involved in IC design and process development with a much-needed overview of key technology trends in this area. Edited by two of the foremost authorities on semiconductor device physics, with contributions by some of the best-known researchers in the field, this comprehensive reference examines such major ULSI devices as MOSFET, nonvolatile semiconductor memory (NVSM), and the bipolar transistor, and the improvements these devices offer in power consumption, low-voltage and high-speed operation, and system-on-chip for ULSI applications. Supplemented with introductory material and references for each chapter as well as more than 400 illustrations, coverage includes: * The physics and operational characteristics of the different components * The evolution of device structures the ultimate limitations on device and circuit performance * Device miniaturization and simulation * Issues of reliability and the hot carrier effect * Digital and analog circuit building blocks
LC Classification NumberTK7874.76.U47 2000
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