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Characterization of Nanostructures by John C. Rivière and Sverre Myhra (2012, Hardcover)

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About this product

Product Identifiers

PublisherCRC Press LLC

ISBN-101439854157

ISBN-139781439854150

eBay Product ID (ePID)102980168

Product Key Features

Number of Pages350 Pages

Publication NameCharacterization of Nanostructures

LanguageEnglish

SubjectMaterials Science / General, Nanoscience, Chemistry / Analytic, Chemistry / General

Publication Year2012

TypeTextbook

Subject AreaTechnology & Engineering, Science

AuthorJohn C. Rivière, Sverre Myhra

FormatHardcover

Dimensions

Item Height0.9 in

Item Weight22.4 Oz

Item Length9.3 in

Item Width6.4 in

Additional Product Features

Intended AudienceCollege Audience

LCCN2012-001213

Reviews"This book provides an understanding of the fundamental concepts of characterisation techniques for nanomaterials such as graphene, fullerenes, carbon nanotubes and quantum dots. The authors have nicely presented the complex theory of the physical techniques in a simple manner that will have immense benefit for the nanoscience community. ... This book will be a valuable asset to students and newcomers to the field. Nanoscience researchers will also benefit as it covers the theory, techniques and applications from basic to advanced levels with up to date bibliographic information." --Tapas Sen, Chemistry World , April 2013, "This book provides an understanding of the fundamental concepts of characterisation techniques for nanomaterials such as graphene, fullerenes, carbon nanotubes and quantum dots. The authors have nicely presented the complex theory of the physical techniques in a simple manner that will have immense benefit for the nanoscience community. e This book will be a valuable asset to students and newcomers to the field. Nanoscience researchers will also benefit as it covers the theory, techniques and applications from basic to advanced levels with up to date bibliographic information." e" Tapas Sen, Chemistry World , April 2013, "This book provides an understanding of the fundamental concepts of characterisation techniques for nanomaterials such as graphene, fullerenes, carbon nanotubes and quantum dots. The authors have nicely presented the complex theory of the physical techniques in a simple manner that will have immense benefit for the nanoscience community. ... This book will be a valuable asset to students and newcomers to the field. Nanoscience researchers will also benefit as it covers the theory, techniques and applications from basic to advanced levels with up to date bibliographic information." -- Tapas Sen, Chemistry World , April 2013, "This book provides an understanding of the fundamental concepts of characterisation techniques for nanomaterials such as graphene, fullerenes, carbon nanotubes and quantum dots. The authors have nicely presented the complex theory of the physical techniques in a simple manner that will have immense benefit for the nanoscience community. 'e¦ This book will be a valuable asset to students and newcomers to the field. Nanoscience researchers will also benefit as it covers the theory, techniques and applications from basic to advanced levels with up to date bibliographic information." 'e" Tapas Sen, Chemistry World , April 2013

Dewey Edition23

IllustratedYes

Dewey Decimal620.1/15

Table Of ContentIntroduction to Characterization of Nanostructures Nanotechnology--In the Beginning There Was the Idea Nanotechnology as a Practical Proposition What Is Nanotechnology? Materials Characterization--What Is It? Current State of 'Best Practice' and QA Section I Techniques and Methods Electron-Optical Imaging of Nanostructures ((HR)TEM, STEM, and SEM) Introduction TEM Overview Interactions of Electrons with Matter Aberration Correction Scanning Transmission Electron Microscopy (STEM) The Issue of Radiation Damage during Imaging and Analysis Examples of SEM Performance Optimization of Image Quality Electron-Optical Analytical Techniques Introduction Loss Processes EDS EELS Technical Implementation and Methods Complementarity of EDS and EELS: A Case Study Photon-Optical Spectroscopy--Raman and Fluorescence Introduction Raman Spectroscopy Fluorescence Spectroscopy Scanning Probe Techniques and Methods Introduction Technical Implementation STM/STS SFM SCM SNOM SECM Scanning Kelvin Probe (SKP) Scanning Ion Current Microscopy (SICM) Future Prospects Techniques and Methods for Nanoscale Analysis of Single Particles and Ensembles of Particles Introduction Photon-Correlation Spectroscopy (PCS) or Dynamic Light Scattering (DLS) Differential Centrifugal Sedimentation (DCS) Zeta Potential Differential Mobility Spectrometry (DMS) Surface Area Determination Surface and Bulk Chemistry Overview--Choices of Technique(s) Section II Applications C60 and Other Cage Structures Introduction Characterization of Fullerenes and Fullerene Compounds Endohedral Fullerenes Fullerites Peapod Fullerenes in CNT Quantum Dots and Related Structures Introduction Particles in 2-D and 3-D Confinement Synthesis Routes for Quantum Dots Characterization of Quantum Dots Absorption and Photoluminescence Spectroscopy of Quantum Dots Carbon Nanotubes and Other Tube Structures Introduction Description of CNT Structure Synthesis Routes Electronic Structure of Graphene and SWCNT General Characteristics of CNTs Other Tube Structures Characterization of Nanotubes Nanowires Introduction Synthesis Routes Characterisation of Nanowires by SEM and TEM Characterisation of Nanowire Heterostructures Characterization Related to Potential Applications Graphene and Other Monolayer Structures Introduction Graphene Structure Summary of Electronic Structure Other 2-D Structures (Nanosheets) Overview of Synthesis Routes Structural Characterization Raman Spectroscopic Characterization Characterization of Electronic Structure Nanostructures--Strategic and Tactical Issues Thinking about Strategy Thinking about Tactics Strategic Issues Preparation of Specimens for Characterization of Nanostructures Ensemble Averages: Limitations 'Soft' Materials--Specimen Preparation Cleanliness User-friendliness Cost-Effectiveness

SynopsisThe techniques and methods that can be applied to materials characterization on the microscale are numerous and well-established. Divided into two parts, Characterization of Nanostructures provides thumbnail sketches of the most widely used techniques and methods that apply to nanostructures, and discusses typical applications to single nanoscale objects, as well as to ensembles of such objects. Section I: Techniques and Methods overviews the physical principles of the main techniques and describes those operational modes that are most relevant to nanoscale characterization. It provides sufficient technical detail so that readers and prospective users can gain an appreciation of the strengths and limitations of particular techniques. The section covers both mainstream and less commonly used techniques. Section II: Applications of Techniques to Structures of Different Dimensionalities and Functionalities deals with the methods for materials characterization of generic types of systems, using carefully chosen illustrations from the literature. Each chapter begins with a brief description of the materials and supplies a context for the methods for characterization. The volume concludes with a series of flow charts and brief descriptions of tactical issues. The authors focus on the needs of the research laboratory but also address those of quality control, industrial troubleshooting, and online analysis. Characterization of Nanostructures describes those techniques and their operational modes that are most relevant to nanoscale characterization. It is especially relevant to systems of different dimensionalities and functionalities. The book builds a bridge between generalists, who play vital roles in the post-disciplinary area of nanotechnology, and specialists, who view themselves as more in the context of the discipline.

LC Classification NumberQC176.8.N35