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Characterisation of Ferroelectric Bulk Materials and Thin Films by Markys G. Cai

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Last updated on Sep 22, 2024 06:35:19 PDTView all revisionsView all revisions

Item specifics

Condition
Brand New: A new, unread, unused book in perfect condition with no missing or damaged pages. See the ...
ISBN-13
9789401777308
Type
NA
Publication Name
NA
ISBN
9789401777308
Book Title
Characterisation of Ferroelectric Bulk Materials and Thin Films
Book Series
Springer Series in Measurement Science and Technology Ser.
Publisher
Springer Netherlands
Item Length
9.3 in
Publication Year
2016
Format
Trade Paperback
Language
English
Illustrator
Yes
Author
Markys G. Cain
Genre
Technology & Engineering, Science
Topic
Measurement, Materials Science / General, Physics / Crystallography, Materials Science / Thin Films, Surfaces & Interfaces
Item Weight
157.1 Oz
Item Width
6.1 in
Number of Pages
X, 280 Pages

About this product

Product Identifiers

Publisher
Springer Netherlands
ISBN-10
9401777306
ISBN-13
9789401777308
eBay Product ID (ePID)
240100966

Product Key Features

Book Title
Characterisation of Ferroelectric Bulk Materials and Thin Films
Number of Pages
X, 280 Pages
Language
English
Publication Year
2016
Topic
Measurement, Materials Science / General, Physics / Crystallography, Materials Science / Thin Films, Surfaces & Interfaces
Illustrator
Yes
Genre
Technology & Engineering, Science
Author
Markys G. Cain
Book Series
Springer Series in Measurement Science and Technology Ser.
Format
Trade Paperback

Dimensions

Item Weight
157.1 Oz
Item Length
9.3 in
Item Width
6.1 in

Additional Product Features

Series Volume Number
2
Number of Volumes
1 vol.
Table Of Content
Electrical Measurement of Ferroelectric Properties.- Piezoelectric Resonance.- Direct Piezoelectric Measurement - The Berlincourt Method.- Characterisation of Pyroelectric Materials.- Interferometry for Piezoelectric Materials and Thin Films.- Temperature Dependence of Ferroelectric and Piezoelectric Properties of PZT Ceramics.- Measurement and Modelling of Self-Heating in Piezoelectric Materials and Devices.- Piezoresponse Force Microscopy.- Indentation Stiffness Analysis of Ferroelectric Thin Films.- Losses in Piezoelectrics via Complex Resonance Analysis.- Dielectric Breakdown in Dielectrics and Ferroelectric Ceramics.- Standards for Piezoelectric and Ferroelectric Ceramics.
Synopsis
This book presents a comprehensive review of the most important methods used in the characterisation of piezoelectric, ferroelectric and pyroelectric materials. It covers techniques for the analysis of bulk materials and thick and thin film materials and devices. There is a growing demand by industry to adapt and integrate piezoelectric materials into ever smaller devices and structures. Such applications development requires the joint development of reliable, robust, accurate and - most importantly - relevant and applicable measurement and characterisation methods and models. In the past few years there has been a rapid development of new techniques to model and measure the variety of properties that are deemed important for applications development engineers and scientists. The book has been written by the leaders in the field and many chapters represent established measurement best practice, with a strong emphasis on application of the methods via worked examples and detailed experimental procedural descriptions. Each chapter contains numerous diagrams, images, and measurement data, all of which are fully referenced and indexed. The book is intended to occupy space in the research or technical lab, and will be a valuable and practical resource for students, materials scientists, engineers, and lab technicians., Electrical Measurement of Ferroelectric Properties.- Piezoelectric Resonance.- Direct Piezoelectric Measurement - The Berlincourt Method.- Characterisation of Pyroelectric Materials.- Interferometry for Piezoelectric Materials and Thin Films.- Temperature Dependence of Ferroelectric and Piezoelectric Properties of PZT Ceramics.- Measurement and Modelling of Self-Heating in Piezoelectric Materials and Devices.- Piezoresponse Force Microscopy.- Indentation Stiffness Analysis of Ferroelectric Thin Films.- Losses in Piezoelectrics via Complex Resonance Analysis.- Dielectric Breakdown in Dielectrics and Ferroelectric Ceramics.- Standards for Piezoelectric and Ferroelectric Ceramics.
LC Classification Number
TA418.5-.84

Item description from the seller

grandeagleretail

grandeagleretail

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    I don't give negatives; However, description was not correct; No price guide was included in this book.As you will see in book pic shown; title states price guide included, no price guide inside. Communication poor, description, no communication price guide missing from this book. Shipping time was weeks before it was even shipped. Blamed the shipping on warehouse. You own & operate a business; your warehouse is not up to standards you change who you do business with. It's your responsibility.

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