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VLSI Test Principles and Architectures : Design for Testability by Xiaoqing Wen, Cheng-Wen Wu and Laung-Terng Wang (2006, Hardcover)

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About this product

Product Identifiers

PublisherElsevier Science & Technology

ISBN-100123705975

ISBN-139780123705976

eBay Product ID (ePID)50803662

Product Key Features

Number of Pages808 Pages

LanguageEnglish

Publication NameVlsi Test Principles and Architectures : Design for Testability

SubjectAutomation, Industrial Design / Product, Electronics / Circuits / Vlsi & Ulsi, Technical & Manufacturing Industries & Trades

Publication Year2006

TypeTextbook

Subject AreaTechnology & Engineering

AuthorXiaoqing Wen, Cheng-Wen Wu, Laung-Terng Wang

FormatHardcover

Dimensions

Item Length9.2 in

Item Width7.5 in

Additional Product Features

Intended AudienceScholarly & Professional

LCCN2006-006869

ReviewsIn the era of large systems embedded in a single system-on-chip (SOC) and fabricated continuously shrinking technologies, it is important to ensure correct behavior of the whole system. Electronic design and test engineers of today have to deal with these complex and heterogeneous systems (digital, mixed-signal, memory), but few have the possibility to study the whole field in a detailed and deep way. This book provides an extremely broad knowledge of the discipline, covering the fundamentals in detail, as well as the most recent and advanced concepts. Michel Renovell, Laboratoire dInformatique, de Robotique et de Microélectronique de Montpellier (LIRMM), Montpellier, France This book combines in a unique way insight into industry practices commonly found in commercial DFT tools but not discussed in textbooks, and a sound treatment of the future fundamentals. The comprehensive review of future test technology trends, including self-repair, soft error protection, MEMS testing, and RF testing, leads students and researchers to advanced DFT research. Hans-Joachim Wunderlich, University of Stuttgart, Germany Recent advances in semiconductor manufacturing have made design for testability (DFT) an essential part of nanometer designs. I am pleased to find a DFT textbook of this comprehensiveness that can serve both academic and professional needs. Andre Ivanov, University of British Columbia, Canada This is the most recent book covering all aspects of digital systems testing. It is a must read for anyone focused on learning modern test issues, test research, and test practices. Kewal K. Saluja, University of Wisconsin-Madison By covering the basic DFT theory and methodology on digital, memory, as well as analog and mixed-signal (AMS) testing, this book stands out as one best reference book that equips practitioners with testable SOC design skills. Yihe Sun, Tsinghua University, Beijing, China, In the era of large systems embedded in a single system-on-chip (SOC) and fabricated continuously shrinking technologies, it is important to ensure correct behavior of the whole system. Electronic design and test engineers of today have to deal with these complex and heterogeneous systems (digital, mixed-signal, memory), but few have the possibility to study the whole field in a detailed and deep way. This book provides an extremely broad knowledge of the discipline, covering the fundamentals in detail, as well as the most recent and advanced concepts. Michel Renovell, Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier (LIRMM), Montpellier, France This book combines in a unique way insight into industry practices commonly found in commercial DFT tools but not discussed in textbooks, and a sound treatment of the future fundamentals. The comprehensive review of future test technology trends, including self-repair, soft error protection, MEMS testing, and RF testing, leads students and researchers to advanced DFT research. Hans-Joachim Wunderlich, University of Stuttgart, Germany Recent advances in semiconductor manufacturing have made design for testability (DFT) an essential part of nanometer designs. I am pleased to find a DFT textbook of this comprehensiveness that can serve both academic and professional needs. Andre Ivanov, University of British Columbia, Canada This is the most recent book covering all aspects of digital systems testing. It is a "must read" for anyone focused on learning modern test issues, test research, and test practices. Kewal K. Saluja, University of Wisconsin-Madison By covering the basic DFT theory and methodology on digital, memory, as well as analog and mixed-signal (AMS) testing, this book stands out as one best reference book that equips practitioners with testable SOC design skills. Yihe Sun, Tsinghua University, Beijing, China, In the era of large systems embedded in a single system-on-chip (SOC) and fabricated in continuously shrinking technologies, it is important to ensure correct behavior of the whole system. Electronic design and test engineers of today have to deal with these complex and heterogeneous systems (digital, mixed-signal, memory), but few have the possibility to study the whole field in a detailed and deep way. This book provides an extremely broad knowledge of the discipline, covering the fundamentals in detail, as well as the most recent and advanced concepts. Dr. Michel Renovell, Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier (LIRMM), Montpellier, France This book combines in a unique way insight into industry practices commonly found in commercial DFT tools but not discussed in textbooks, and a sound treatment of the technical fundamentals. The comprehensive review of future test technology trends including self- repair, soft error protection, MEMS testing, and RF testing leads students and researchers to advanced DFT research. Hans-Joachim Wunderlich, Professor, Institut für Technische Informatik, University of Stuttgart, Stuttgart, Germany Recent advances in semiconductor manufacturing have made design for testability (DFT) an essential part of nanometer designs. I am pleased to find a DFT textbook of this comprehensiveness that can serve both academic and professional needs. Andre Ivanov, IEEE Fellow and Professor, University of British Columbia, Canada This is the most recent book covering all aspects of digital systems testing. It is a must read for anyone focused on learning modern test issues, test research, and test practices. Kewal K. Saluja, IEEE Fellow and Professor, University of Wisconsin-Madison This book's focus on VLSI test principles and DFT architectures, while deemphasizing test algorithms, is an ideal choice for undergraduate education. Yihe Sun, Professor, Institute of Microelectronics, Tsinghua University, Beijing, China, In the era of large systems embedded in a single system-on-chip (SOC) and fabricated continuously shrinking technologies, it is important to ensure correct behavior of the whole system. Electronic design and test engineers of today have to deal with these complex and heterogeneous systems (digital, mixed-signal, memory), but few have the possibility to study the whole field in a detailed and deep way. This book provides an extremely broad knowledge of the discipline, covering the fundamentals in detail, as well as the most recent and advanced concepts. Michel Renovell, Laboratoire d'Informatique, de Robotique et de Microlectronique de Montpellier (LIRMM), Montpellier, France This book combines in a unique way insight into industry practices commonly found in commercial DFT tools but not discussed in textbooks, and a sound treatment of the future fundamentals. The comprehensive review of future test technology trends, including self-repair, soft error protection, MEMS testing, and RF testing, leads students and researchers to advanced DFT research. Hans-Joachim Wunderlich, University of Stuttgart, Germany Recent advances in semiconductor manufacturing have made design for testability (DFT) an essential part of nanometer designs. I am pleased to find a DFT textbook of this comprehensiveness that can serve both academic and professional needs. Andre Ivanov, University of British Columbia, Canada This is the most recent book covering all aspects of digital systems testing. It is a "must read" for anyone focused on learning modern test issues, test research, and test practices. Kewal K. Saluja, University of Wisconsin-Madison By covering the basic DFT theory and methodology on digital, memory, as well as analog and mixed-signal (AMS) testing, this book stands out as one best reference book that equips practitioners with testable SOC design skills. Yihe Sun, Tsinghua University, Beijing, China, In the era of large systems embedded in a single system-on-chip (SOC) and fabricated continuously shrinking technologies, it is important to ensure correct behavior of the whole system. Electronic design and test engineers of today have to deal with these complex and heterogeneous systems (digital, mixed-signal, memory), but few have the possibility to study the whole field in a detailed and deep way. This book provides an extremely broad knowledge of the discipline, covering the fundamentals in detail, as well as the most recent and advanced concepts. Michel Renovell, Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier (LIRMM), Montpellier, France This book combines in a unique way insight into industry practices commonly found in commercial DFT tools but not discussed in textbooks, and a sound treatment of the future fundamentals. The comprehensive review of future test technology trends, including self-repair, soft error protection, MEMS testing, and RF testing, leads students and researchers to advanced DFT research. Hans-Joachim Wunderlich, University of Stuttgart, Germany Recent advances in semiconductor manufacturing have made design for testability (DFT) an essential part of nanometer designs. I am pleased to find a DFT textbook of this comprehensiveness that can serve both academic and professional needs. Andre Ivanov, University of British Columbia, Canada This is the most recent book covering all aspects of digital systems testing. It is a "must read? for anyone focused on learning modern test issues, test research, and test practices. Kewal K. Saluja, University of Wisconsin-Madison By covering the basic DFT theory and methodology on digital, memory, as well as analog and mixed-signal (AMS) testing, this book stands out as one best reference book that equips practitioners with testable SOC design skills. Yihe Sun, Tsinghua University, Beijing, China, Testing techniques for VLSI circuits are today facing many exciting and complex challenges. In the era of large systems embedded in a single chip (SOC) and fabricated in continuously shrinking technologies, it is important to ensure correct behavior of the whole system. Electronic design and test engineers of today have to deal with these complex and heterogeneous systems (digital, mixed-signal, memory), but few have the possibility to study the whole field in a detailed and deep way. This book provides an extremely broad knowledge of the discipline, covering the fundamentals in detail, as well as the most recent and advanced concepts. It is a textbook for teaching the basics of fault simulation, ATPG, memory testing, DFT and BIST. But, it is also a complete testability guide for an engineer who wants to learn the latest advances in DFT for soft error protection, logic BIST for at-speed testing, DRAM BIST, test compression, MEMS testing, FPGA testing, RF testing etc... Michel Renovell; Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, Montpellier, France This book combines in a unique way insight into industry practices commonly found in commercial DFT tools but not discussed in textbooks, and a sound treatment of the technical fundamentals. The comprehensive review of future test technology trends including self- repair, soft error protection, MEMS testing or RF testing leads students and researchers to advanced DFT research. Prof. Dr. Hans-Joachim Wunderlich; Institut für Technische Informatik, University of Stuttgart, Stuttgart, Germany Recent advances in semiconductor manufacturing have made design for testability (DFT) an essential part of nanometer designs. The lack of an up-to-date DFT textbook that covers the most recent DFT techniques, such as at-speed scan testing, logic built-in self-test (BIST), test compression, memory built-in self-repair (BISR), and future test technology trends, has created problems for students, instructors, researchers and practitioners who need to master modern DFT technologies. I am pleased to find a DFT textbook of this comprehensiveness that can serve both academic and professional needs. Andre Ivanov, IEEE Fellow and Professor, University of British Columbia, Canada This is the most recent book covering all aspects of digital systems testing. It is a must read for anyone focused on learning modern test issues, test research, and test practices. Kewal K. Saluja, IEEE Fellow and Professor, University of Wisconsin-Madison This book's focus on VLSI test principles and DFT architectures, while deemphasizing test algorithms, is an ideal choice for undergraduate education. Yihe Sun, Professor, Institute of Microelectronics, Tsinghua University, Beijing, China, In the era of large systems embedded in a single system-on-chip (SOC) and fabricated continuously shrinking technologies, it is important to ensure correct behavior of the whole system. Electronic design and test engineers of today have to deal with these complex and heterogeneous systems (digital, mixed-signal, memory), but few have the possibility to study the whole field in a detailed and deep way. This book provides an extremely broad knowledge of the discipline, covering the fundamentals in detail, as well as the most recent and advanced concepts. Michel Renovell, Laboratoire d'Informatique, de Robotique et de Micro lectronique de Montpellier (LIRMM), Montpellier, France This book combines in a unique way insight into industry practices commonly found in commercial DFT tools but not discussed in textbooks, and a sound treatment of the future fundamentals. The comprehensive review of future test technology trends, including self-repair, soft error protection, MEMS testing, and RF testing, leads students and researchers to advanced DFT research. Hans-Joachim Wunderlich, University of Stuttgart, Germany Recent advances in semiconductor manufacturing have made design for testability (DFT) an essential part of nanometer designs. I am pleased to find a DFT textbook of this comprehensiveness that can serve both academic and professional needs. Andre Ivanov, University of British Columbia, Canada This is the most recent book covering all aspects of digital systems testing. It is a "must read" for anyone focused on learning modern test issues, test research, and test practices. Kewal K. Saluja, University of Wisconsin-Madison By covering the basic DFT theory and methodology on digital, memory, as well as analog and mixed-signal (AMS) testing, this book stands out as one best reference book that equips practitioners with testable SOC design skills. Yihe Sun, Tsinghua University, Beijing, China

Dewey Edition22

IllustratedYes

Dewey Decimal621.39/5

Table Of ContentChapter 1 - Introduction Chapter 2 - Design for Testability Chapter 3 - Logic and Fault Simulation Chapter 4 - Test Generation Chapter 5 - Logic Built-In Self-Test Chapter 6 - Test Compression Chapter 7 - Logic Diagnosis Chapter 8 - Memory Testing and Built-In Self-Test Chapter 9 - Memory Diagnosis and Built-In Self-Repair Chapter 10 - Boundary Scan and Core-Based Testing Chapter 11 - Analog and Mixed-Signal Testing Chapter 12 - Test Technology Trends in the Nanometer Age

SynopsisThis book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume., This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

LC Classification NumberTK7874.75.V587 2006