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Picture 1 of 24
FEI QUANTA 200-3D DUAL BEAM SCANNING ELECTRON MICROSCOPE FIB-SEM w OMNIPROBE, PC
US $89,999.00
or Best Offer
Condition:
“Used, as shown, comes with all/ only items/ components/ accessories/ parts/ cables as shown”
Shipping
Located in: Singapore, none, Singapore
International shipment of items may be subject to customs processing and additional charges.
Located in: Singapore, none, Singapore
Delivery:
Varies
Returns:
Payments:
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Seller assumes all responsibility for this listing.
eBay item number:166669142024
Item specifics
- Condition
- Used
- Seller Notes
- “Used, as shown, comes with all/ only items/ components/ accessories/ parts/ cables as shown”
- Brand
- FEI
- Type
- Focused Ion Beam-Scanning Electron Microscope - Dual Beam FIB-SEM
- Microscope Type
- Scanning Electron Microscope (SEM)
- Model
- Quanta 200 3D
- MPN
- Quanta 200 3D
Item description from the seller
Seller assumes all responsibility for this listing.
eBay item number:166669142024
Shipping and handling
Item location:
Singapore, none, Singapore
Services available:
Ships to:
United States
Excludes:
Russian Federation, Ukraine
Return policy
Return policy details |
---|
Seller does not accept returns |
Refer to eBay Return policyopens in a new tab or window for more details. You are covered by the eBay Money Back Guaranteeopens in a new tab or window if you receive an item that is not as described in the listing.
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Seller feedback (916)
b***e (544)- Feedback left by buyer.
Past year
Verified purchase
Received as described, fast shipping and very well packed. Recommend seller
a***0 (61)- Feedback left by buyer.
Past month
Verified purchase
Item arrived as described and in good condition. Thank you.
n***o (38)- Feedback left by buyer.
Past month
Verified purchase
Great communication
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