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Machine Learning in Vlsi Computer-aided Design, Hardcover by Elfadel, Ibrahim...

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Item specifics

Condition
Good: A book that has been read but is in good condition. Very minimal damage to the cover including ...
ISBN
9783030046651
Publication Year
2019
Format
Hardcover
Language
English
Book Title
Machine Learning in Vlsi Computer-Aided Design
Author
Duane S. Boning
Item Length
9.3in
Publisher
Springer International Publishing A&G
Genre
Technology & Engineering, Computers
Topic
Systems Architecture / General, Electronics / Circuits / General, Logic Design
Item Width
6.1in
Item Weight
43.5 Oz
Number of Pages
Xxii, 694 Pages

About this product

Product Information

This book provides readers with an up-to-date account of the use of machine learning frameworks, methodologies, algorithms and techniques in the context of computer-aided design (CAD) for very-large-scale integrated circuits (VLSI). Coverage includes the various machine learning methods used in lithography, physical design, yield prediction, post-silicon performance analysis, reliability and failure analysis, power and thermal analysis, analog design, logic synthesis, verification, and neuromorphic design. Provides up-to-date information on machine learning in VLSI CAD for device modeling, layout verifications, yield prediction, post-silicon validation, and reliability; Discusses the use of machine learning techniques in the context of analog and digital synthesis; Demonstrates how to formulate VLSI CAD objectives as machine learning problems and provides a comprehensive treatment of their efficient solutions; Discusses the tradeoff between the cost of collecting data and prediction accuracy and provides a methodology for using prior data to reduce cost of data collection in the design, testing and validation of both analog and digital VLSI designs. From the Foreword As the semiconductor industry embraces the rising swell of cognitive systems and edge intelligence, this book could serve as a harbinger and example of the osmosis that will exist between our cognitive structures and methods, on the one hand, and the hardware architectures and technologies that will support them, on the other....As we transition from the computing era to the cognitive one, it behooves us to remember the success story of VLSI CAD and to earnestly seek the help of the invisible hand so that our future cognitive systems are used to design more powerful cognitive systems. This book is very much aligned with this on-going transition from computing to cognition, and it is with deep pleasure that I recommend it to all those who are actively engaged in this exciting transformation. Dr. Ruchir Puri, IBM Fellow, IBM Watson CTO & Chief Architect, IBM T. J. Watson Research Center

Product Identifiers

Publisher
Springer International Publishing A&G
ISBN-10
3030046656
ISBN-13
9783030046651
eBay Product ID (ePID)
8038678742

Product Key Features

Book Title
Machine Learning in Vlsi Computer-Aided Design
Author
Duane S. Boning
Format
Hardcover
Language
English
Topic
Systems Architecture / General, Electronics / Circuits / General, Logic Design
Publication Year
2019
Genre
Technology & Engineering, Computers
Number of Pages
Xxii, 694 Pages

Dimensions

Item Length
9.3in
Item Width
6.1in
Item Weight
43.5 Oz

Additional Product Features

Number of Volumes
1 Vol.
Lc Classification Number
Tk7867-7867.5
Table of Content
Chapter1: A Preliminary Taxonomy for Machine Learning in VLSI CAD.- Chapter2: Machine Learning for Compact Lithographic Process Models.- Chapter3: Machine Learning for Mask Synthesis.- Chapter4: Machine Learning in Physical Verification, Mask Synthesis, and Physical Design.- Chapter5: Gaussian Process-Based Wafer-Level Correlation Modeling and its Applications.- Chapter6: Machine Learning Approaches for IC Manufacturing Yield Enhancement.- Chapter7: Efficient Process Variation Characterization by Virtual Probe.- Chapter8: Machine learning for VLSI chip testing and semiconductor manufacturing process monitoring and improvement.- Chapter9: Machine Learning based Aging Analysis.- Chapter10: Extreme Statistics in Memories.- Chapter11: Fast Statistical Analysis Using Machine Learning.- Chapter12: Fast Statistical Analysis of Rare Circuit Failure Events.- Chapter13: Learning from Limited Data in VLSI CAD.- Chapter14: Large-Scale Circuit Performance Modeling by Bayesian Model Fusion.- Chapter15: Sparse Relevance Kernel Machine Based Performance Dependency Analysis of Analog and Mixed-Signal Circuits.- Chapter16: SiLVR: Projection Pursuit for Response Surface Modeling.- Chapter17: Machine Learning based System Optimization and Uncertainty Quantification of Integrated Systems.- Chapter18: SynTunSys: A Synthesis Parameter Autotuning System for Optimizing High-Performance Processors.- Chapter19: Multicore Power and Thermal Proxies Using Least-Angle.- Chapter20: A Comparative Study of Assertion Mining Algorithms in GoldMine.- Chapter21: Energy-Efficient Design of Advanced Machine Learning Hardware.
Copyright Date
2019
Illustrated
Yes

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