PARTICLES ON SURFACES: DETECTION: ADHESION, AND REMOVAL By K L Mittal

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Item specifics

Condition
Like New
A book that looks new but has been read. Cover has no visible wear, and the dust jacket (if applicable) is included for hard covers. No missing or damaged pages, no creases or tears, and no underlining/highlighting of text or writing in the margins. May be very minimal identifying marks on the inside cover. Very minimal wear and tear. See the seller’s listing for full details and description of any imperfections. See all condition definitionsopens in a new window or tab
Seller Notes
“See description”
Book Title
Particles on Surfaces: Detection: Adhesion, and Removal
ISBN-10
0824795350
ISBN
9780824795351
Subject Area
Technology & Engineering, Science
Publication Name
Particles on Surfaces : Detection: Adhesion, and Removal
Publisher
CRC Press LLC
Item Length
9.3 in
Subject
Materials Science / General, Materials Science / Thin Films, Surfaces & Interfaces, Chemistry / Physical & Theoretical, Chemistry / General
Publication Year
1994
Type
Textbook
Format
Hardcover
Language
English
Item Height
0.9 in
Author
K. L. Mittal
Item Weight
34.3 Oz
Item Width
5.9 in
Number of Pages
440 Pages
Category

About this product

Product Identifiers

Publisher
CRC Press LLC
ISBN-10
0824795350
ISBN-13
9780824795351
eBay Product ID (ePID)
309447

Product Key Features

Number of Pages
440 Pages
Language
English
Publication Name
Particles on Surfaces : Detection: Adhesion, and Removal
Subject
Materials Science / General, Materials Science / Thin Films, Surfaces & Interfaces, Chemistry / Physical & Theoretical, Chemistry / General
Publication Year
1994
Type
Textbook
Author
K. L. Mittal
Subject Area
Technology & Engineering, Science
Format
Hardcover

Dimensions

Item Height
0.9 in
Item Weight
34.3 Oz
Item Length
9.3 in
Item Width
5.9 in

Additional Product Features

Intended Audience
Scholarly & Professional
Dewey Edition
22
Illustrated
Yes
Dewey Decimal
620/.44
Table Of Content
Particles on surfaces - adhesion induced deformations; surface force tensile interactions between micrometer size particles and a polyester-PDMS block copolymer substrate; polymer to particle adhesion probed with atomic force microscopy; surface particle contamination identification in microelectronics; an overview of spacecraft particulate contamination phenomena; contamination on optical surfaces-concerns, prevention, detection, and removal; an advanced surface particle and molecular contaminant identification, removal, and collection system; the role of air ionization in reducing surface contamination by particles in the cleanroom; selecting a contamination-free deburring process - testing abrasive blasting media; particle generation and control in tubing and piping connection design; detection and identification of particles on silicon surfaces; the characterization of particles on spacecraft returned from orbit; a light-scattering method for determining the composition of particles on surfaces; light scattering by spherical particles on planar multi-layered substrates; new test procedure for the examination of the particulate cleanliness of technical surfaces; discrimination between particulate and film type contamination on surfaces by means of total reflection X-ray fluorescence spectrometry; particle characterization on surfaces by Auger electron spectroscopy; interrogating the behavior of micrometer-sized particles on surfaces with focused acoustic waves; removal of glass particles from glass surfaces - a review; particle removal characteristics of surface cleaning methods involving sonication and/or spray impingement; fluid dynamics of liquid jets used for particle removal from surfaces; enhanced particle removal from inertial guidance instrument parts by fluorocarbon surfactant solutions; laser cleaning techniques for the removal of small surface particulates.
Synopsis
This work comprises the proceedings of the Fourth Symposium on Particles on Surfaces. Papers cover: adhesion-induced deformations of particles on surfaces; the use of atomic force microscopy in probing particle-particle adhesion; particle contamination in microelectronics, on spacecraft, and on optical surfaces; the role of air ionization in reducing surface contamination by particles in the cleanroom; abrasive blasting media for contamination-free deburring processes; and more.;The book is intended for physical, chemical, surface and colloid chemists, materials scientists; polymers, plastics, electrical and electronics, computer, chemical and mechanical engineers; and upper-level undergraduate and graduate students in these disciplines.

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