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Reliability Characteristics of Rare-Earth Oxides and Gate Stacks on Ge by Rahman M. Shahinur (2013, Trade Paperback)

Book Title
Reliability Characteristics of Rare-Earth Oxides and Gate Stacks on Ge
Author
Rahman M. Shahinur
Format
Trade Paperback
Language
English
Topic
Physics / General
Publication Year
2013
Genre
Science
Number of Pages
228 Pages

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