advancements in semiconductor technology have typically required
chipmakers to purchase new ATE systems every two to three years.
However, because the T2000 Series is based on a truly open,
interoperable architecture, it lets chipmakers implement a
cost-effective solution that adapts to their ever-changing needs. The
OPENSTAR architecture, which Advantest was instrumental in helping to
develop, also allows for more flexible test functionality. With its
standard specifications outlined by the STC, the architecture is
accessible to all test-product vendors—enabling them to provide the best
possible test solutions to their customers.
T2000 Series incorporates a range of features and capabilities that
leverage the benefits of the OPENSTAR platform. The T2000 test systems
can be easily configured for testing microprocessors, microcontrollers
and radio-frequency (RF) devices by choosing from an expanding menu of
test modules. Together with these modules, the T2000 enables
unprecedented customization of test capabilities and delivers unmatched
support for parallel testing.
Developed to meet
the demands of a broad array of customers, the T2000 Series offers
integrated device manufacturers (IDMs) a lower cost of test and
evaluation. It also provides fabless companies a flexible platform with
interchangeable modules that easily adapts to changing device
requirements, and extends tester life and lowers the risk of equipment
obsolescence for test houses.
T2000 Series Attributes
T2000 Series satisfies a range of test requirements through its ability
to combine a variety of test modules on a single platform, including
250MHz digital modules, low- and high-current device power-supply
modules, and synchronization modules (for multiple time-domain and
asynchronous-functional test). The tester can thus accommodate multiple
testing scenarios, including high-speed device test, at-speed test of
sophisticated devices, design for test (DFT) to reduce test cost, and
engineering test conducted in laboratory settings. All modules support
high-speed data transfer via the OPENSTAR bus and high-speed test
A key feature of
the T2000 Series is its ability to deliver true hardware and software
interoperability. The systems utilize OPENSTAR’s Open Architecture
Software, which provides the common ground required for EDA and ATE
companies to jointly adopt and support a variety of industry standards,
together with a mainframe that hosts a dual computing architecture
featuring both the system and site controllers. Multiple controllers
allow for truly independent, concurrent testing of multiple devices.
The T2000 Series
is highly versatile; it utilizes a Windows 2000-based operating system,
while users can employ either C++ or the OPENSTAR Test Programming
Language (OTPL) for their test programs. The first system in the series
is capable of performing high-speed microprocessor tests with
high-current device power supplies and optimizes test cost with
pin/board slice architecture.